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5497 results for found: utilisé Wafer Testing And Metrology

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  • ACCRETECH / TSK / XANDEX: X1412

    ACCRETECH / TSK / XANDEX X1412 Prober inking system, 8" Pneumatic inker Programmable dot counter Automatic cartridge priming Dot range: 15-50 mil DM-2 or DM-2.3 disposable cartridges Available sizes: A5, A6 and A8 Precision alignment: X: ±0.125” Y: ±0.19” Z: ±0.11” Model number: 350-0002 2008 vintage.
  • ACCRETECH / TSK / XANDEX: X1412

    ACCRETECH / TSK / XANDEX X1412 Prober inking system, 8" Pneumatic inker Programmable dot counter Automatic cartridge priming Dot range: 15-50 mil DM-2 or DM-2.3 disposable cartridges Available sizes: A5, A6 and A8 Precision alignment: X: ±0.125” Y: ±0.19” Z: ±0.11” Model number: 350-0002 2008 vintage.
  • ACCRETECH / TSK / XANDEX: X1412

    ACCRETECH / TSK / XANDEX X1412 Prober inking system, 8" Pneumatic inker Programmable dot counter Automatic cartridge priming Dot range: 15-50 mil DM-2 or DM-2.3 disposable cartridges Available sizes: A5, A6 and A8 Precision alignment: X: ±0.125” Y: ±0.19” Z: ±0.11” Model number: 350-0002 2008 vintage.
  • ADE: 7200

    ADE 7200 Inspection system, up to 8" (2) Send elevators (1) Receive elevator Resistivity tester 2-Track sorter Currently installed Can be inspected and demonstrated.
  • ADE: 9530-NT ULTRAGAGE

    ADE 9530-NT UltraGage Wafer measuring system, 8" Thickness measurements to 150 um Measures 8700 data points in under 60 seconds High bow/warp measurement capability Thin wafer/high warp wafer handling Graphical user interface based on Windows NT Included: UltraGage module Autoloader module Advanced system controller with monitor, keyboard and trackball Printer UPS Line conditioner PFA cassettes (those with laser tags do not have handles) ACS 2000 controller 2000 vintage.
  • ADE: 7000

    ADE: 7000 WaferCheck Wafer Sorter 2 send 8 receive Flatness/Bow/Warp Hi Res Lo Res Computer Upgrade and E station Upgrades available.
  • ADE: 9300

    ADE 9300 Thickness measurement system, 4" to 8" Resistivity range: 0.2 to 200 Ohmcm Flatness station with pre-aligner VAX ADE Series 350 ARM Controller High res station Arm robot (2) Loaders / (2) Unloaders Currently installed with power Can be inspected and demonstrated.
  • ADE: 6300

    ADE 6300 Wafer gauging system Currently set up for 6", 8" or 12" wafers Measures thickness of silicon wafers up to 12" diameter Power requirements: 115 V single phase, 40 Watts Power supply: AC electric power E-station: parallel and serial bus connectors on the back.
  • ADE: 6300

    ADE 6300 Wafer gauging system Currently set up for 6", 8" or 12" wafers Measures thickness of silicon wafers up to 12" diameter Power requirements: 115 V single phase, 40 Watts Power supply: AC electric power E-station: parallel and serial bus connectors on the back.
  • ADE: 6033T

    ADE 6033T Benchtop, non-contact thickness, taper testers Unit will create a thickness measurement of flat, low resistivity (less than 100 ohm-cm) objects with a thickness less than 0.040" (999.9 microns) Measures: wafers, hard drive disks, CD/DFD platters Linear slide option: felt covered aluminum mounts Measurement in microns or mils (changed by sliding an internal switch) Modified to increase range on display to 90mils Thickness range: 0.002"( 50.8 microns) to 0.040" (999.9 microns) Taper measurement: up to 0.010" or 250 um Measurement reading time: 0.5 seconds Overage indicator LED: indicates wafer thickness out of setup range or probes improperly setup Adjustable HI/LO limit indicators: indicates if wafer thickness is greater than or less than specified values Limit values set by adjusting front panel potentiometers Display will blank and over-range indicator will illuminate if invalid measurement conditions are present Comes with a BNC connector on the back to allow connection for DC output to analog meter, chart recorder, or data logger/ computer Analog voltage output: 0-4V (0-10V in metric range) Output impedance: <10 ohms Operating voltage: 110 V, 60 Hz.
  • ADE: 9650

    ADE 9650 System ASC controller RES station Pre aligner (2) cassette stations Rest station ARM robot E station.
  • ADE: 7000

    ADE 7000 Thickness sorter.
  • ADE: 7000

    ADE 7000 Thickness sorter.
  • ADE: 9500

    ADE 9500 Wafer measuring system ACS-1000 controller Currently stored in cleanroom.
  • ADE: 7000

    ADE 7000 Wafercheck inspection / resistance bow warp check system, 4" to 6" (4) Senders (12) Receivers Heads: low and high resolution Thickness station High res station Pre-aligner Manual Does not include computer (compatible with HP computer) Some spare elevators are available.
  • ADE: 7000

    ADE: 7000 Wafercheck inspection / resistance bow warp check system, 4" to 6" (4) Senders (12) Receivers Heads: low and high resolution Thickness station High res station Pre-aligner Manual Does not include computer (compatible with HP computer) Some spare elevators are available.
  • ADE: 7000

    ADE 7000 Wafercheck inspection / resistance bow warp check system.
  • ADE: 6034 MICROSENSE

    ADE 6034 MicroSense thickness gauge.
  • ADE: 9530-NT ULTRAGAGE

    ADE 9530-NT UltraGage Wafer measuring system, 8" Thickness measurements to 150 um Measures 8700 data points in under 60 seconds High bow/warp measurement capability Thin wafer/high warp wafer handling Graphical user interface based on Windows NT Included: UltraGage module Autoloader module Advanced system controller with monitor, keyboard and trackball Printer UPS Line conditioner PFA cassettes (those with laser tags do not have handles) ACS 2000 controller 2000 vintage.
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