JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9040833
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | 1990 vintage.
  • JEOL: JSM 6700F

    Details
    ID#:
    9026910
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM), with EDS | Thermo Noran EDS and Supporting hardware & software | Electron gun type: Cold field emission | Resolution: 2-3nm at 1 kV, 4mm working distance | Resolution: Independent on probe current | SE Detectors: 2 | Probe current stability: Better than 0.5% / hr. and compensated | Probe current control: Integrated and continuous | Vacuum system: Efficient, low contamination. Independent pumping for different stages. | | Image Resolution: | 1.0 nm @ 15 kV, 4-6 mm WD | 1.5 nm @ 15 kV, 15 mm WD | 2.2 nm @ 1 kV, 2-4 mm WD | | Resolution-Probe ct.: | Independent of probe current up to high current values | | Magnification Range: | 25X to 19,000X in LM mode | 100X to 650,000X in SEM mode | | Probe current stability: | 0.3% / hr., compensated | | Probe current control: | Integrated and continuous | | SE Detectors: | 2, very efficient (low magnetic flux at the bottom of the OL) | | Magnetic samples analysis: | Easy at listed resolution, due to low magnetic flux at the bottom of the OL | | Accelerating voltage: | 0.5 to 2.9kV (in 10V steps) | 2.9 to 30kV (in 100V steps) | | | A. Computer Controlled Operation: | 1. NT v 4.0 Operating System | 2. Pentium III PC with minimum configuration of 128MB RAM, l0GB hard disk, CD RW, and ZIP drive | 3. Mouse and keyboard operation | 4. Digital knobset for manual control | 5. High resolution, 18-inch flat panel display with 1280 x 1024 pixels for image display and GUI control | 6. User login function with customized recipe recall | 7. Network ready with Ethernet interface | 8. Image archiving and database management with thumbnail display supporting BMP, TIF and JPEG file formats | | B. Electron Optical System: | 1. Field emission gun with cold cathode tip | 2. User selectable emission current (up to 20~A) | 3. Fully automated column linkage for changes in beam voltage, current and WD | 4. Column condition memory | 5. Digital noise canceler | 6. Gun isolation valve | 7. Adjustable objective lens aperture strip | 8. Conical objective lens | | C. Detectors: | 1. Through-the-lens secondary electron detector for operation between 2mm and15mm WD | 2. Conventional in-chamber E-T type secondary electron detector | | D. Scanning System: | 1. Digital scan generator system with up to 2048 x 2048 x 8 bit resolution | 2. Digital scan rotation linked to kV and WD | 3. Scanning modes include: full frame, reduced field, spot mode, and line scan | 4. 10 user selectable scan speeds | 5. Scaler measurement and annotation system including: | a. point-to-point line | b. angle and line | c. circle, square, arrow, line and text | d. calibration routine for standards | e. end point magnifying window | f. annotation can be saved, loaded and appended | | E. Image Framestore and Processing System: | 1. Frame averaging | 2. Pixel Integration | 3. LUT functions such as gamma,gray scale expansion, pseudo-color | | F. Specimen Chamber and Stage: | 1. Large specimen exchange port for samples up to 6-inch diameter | 2. Tilt eucentric goniometer stage: | a. 50mm in X | b. 70mm in Y | c. 24mm in Z | d. -5° to +60° tilt | e. 360° continuous rotation | f. Ferrofluidic feedthroughs for smooth motion in X and Y | 3. PC automation of X, Y and R including: | a. Joystick or mouse control | b. Move-to-center point and shoot | c. Step by field or size | d. Computer eucentric rotation | e. Snap Shot Reconnaissance Map for high magnification navigation | f. Points table | g. Graphical representation of holders | h. Soft limits linked to holder | i. Hard limits | j. Auto stage calibration | k. Auto homing for sample exchange | 4. Sample Holder Kit including: | a. 12.5mm dia. x 10mm tall stub | b. 26mm dia. x 10mm tall stub | c. 2-inch dia. x 10mm tall bulk holder with inserts for 7 each 12.5mm stubs | or 8 each 10mm stubs | d. 4-inch bulk holder | e. 6-inch wafer holder | 5. Sample grounding alarm | 6. Specimen current feedthrough | | G. Vacuum System: | 1. Fully automatic and fail safe | 2. Pneumatically controlled valving | 3. Ion pumped UHV gun chamber | 4. Two ion pumped intermediate chambers | 5. Ion pump battery back up system | 6. Sample chamber pumped by DP-DP cascade system | 7. Liquid Nitrogen cooled anti-contaminator fixed below the OL | 8. Penning vacuum gauge with read out on GUI | | ETP-IR-CVS-FPD - ETP USA INFRARED SEM CHAMBERVIEW SYSTEM | The Chamberview image is displayed on a 6.4" LCD flat panel display monitor which can be positioned anywhere on the SEM. The display is totally independent of the SEM is computer and requires no computer interface. Includes IR LED illumination, CCD camera/lens and all cables. (JU2000740) | | SM-36120(PCD) - PROBE CURRENT DETECTOR: | Pneumatically driven Faraday cup built into the column just below the final aperture. Used to measure probe current or to function as a beam shutter. Can be | automated from an external computer. Requires KE-485 or SM-34100 (AEM). (293601) | | KE-485 - KEITHLEY MICROAMMETER: MODEL 485 | Digital microammeter for measuring absorbed current (or true probe current when used wIth PCD) ( KE-485 ) | | SIS-DOCU - SIS ANALYSIS DOCU 3.0 IMAGE SOFTWARE | analySIS Docu 3.0, Digital image-analysis software(to be run with MB Windows 95/98/NT} for acquisition, documentation, interactive measurement and archiving. | Docu contains functions such as File (defining page-layout, TWAIN interface, defining image-file formats, etc.) , Editing (text editor, editing tables/sheets, diagrams, etc.) , Database (set-up, structuring, queries, adding data records, etc.) | Image (acquisition, logical input channels, calibration, series of images, multi-phase threshold settings, setting magnification, etc.), Oper (gray-value transformation, image editing, shading correction, filters, image geometry, | arithmetic, etc.) , Measurement (interactive) measurement, classification, phase analysis, perspective, statistics, etc.), Special (macro-recorder, defining configurations, etc.),Window, and Help. In addition, Docu offers: the Multiple Viewport Manager, Multiple Image Alignment, Differential Contrast Enhancement, and the Add-In-Manager. Docu processes gray-scale images up to 16 bits, and color images via the RGB or HSI color models up to 24 bits per pixel (JU2002313) | | TN-V4105-DSI - VANTAGE DSI DIGITAL X-RAY MICROANALYSIS | VANTAGE DSI Digital X-ray Microanalysis and SpectralImaging System. Includes Digital Acquisition Engine with PULSTAR Digital Pulse Processing and Digital Spectral Imaging Electronics, SEM PULSTAR digital pulse processor rate files, integrated Pentium OII 600MHz minitower with 64-bit SVGA graphics, Ethernet 10/100Base-T network interface card, SCSI controller card, 192MB memory, 10GB hard disk drive, 1.44MB floppy disk drive, CD ROM, 2 serial ports, 1 parallel port, 17" color monitor with 1600x1200 maximum pixel resolution, Microsoft Windows NT workstation 4.x and VANTAGE operating environments. | Also includes Qualitative and Quantitative analysis software providing Spectral Display, Spectator, standardless, full standards and mixed standards quantitative analysis, PROZA, ZAF and Bence-Albee matrix corrections, and Intelligent Qualitative and Quantitative analysis, Digital Spectral Imaging | Acquisition and Display software providing multicell Image Display, acquisition of electron images up to 2048x2048 pixels, acquisition of point dwell x-ray | maps up to 1024x1024 pixels, Ultimap fast x-ray mapping, linescan acquisition and display, Image File Gallery, and EasyMICRO. Includes A120V and Al12V | software. Requires X10S-XXX scan interface, x-ray detector andX911V installation. ( JU2002128 ) | | TN-X1O5-6706 - INTERFACE MODULE FOR ELECTRON MICROSCOPE | Includes one signal input. ( JU2001690 ) | | TN-6706A-3SES - PIONEER EDS DETECTOR: | With a NORVAR light element window, 30mm2 straight Si(Li) crystal, 134eV resolution at Mn for the JEOL JSM-6700F FESEM, 130R port and 35 degree entry | ( JU2002444 ) | | TN-DET-75-N - DEWAR KIT FOR NORAN ANALYZERS | Includes 7.5 liter dewar option and LN sensor. ( JU2001527 ) | | TN.A600-6706W - MICROSCOPE COLUMN AUTOMATION PACKAGE: | Microscope Column Automation Package, includes control of selected parameters, storage and recall of operating parameter files, stage control if supported on microscope (requires 204), on.line monitoring of column parameters for stage | automation. ( JU2002443 ) | | TN-A160 - FILM LAYER ANALYSIS SOFTWARE | Analysis of up to 6 film layers on substrate, film thickness and film composition determination using filter-fit or background modeling and Gausssian deconvolution quantitation methods (TN-A160 ) | | Equipment description: | Scanning Electron Microscope (main) JSM-6700F | IR SEM Chamberview System ETP-IR-CVS-FPD | Probe current detector SM-36120(PCD) | Microammeter Keithley-485 KE-485 | SIS Image Analysis Software SIS-DOCU | Vantage DSI X-ray Microanalysis System TN-V4105-DSI | Interface Module for SEM TN-X105-6706 | EDS Detector (Pioneer) TN-6706A-3SES | Dewar Kit for Noran Analyzers TN-DET-75-N | Microscope Column Automation Package TN-A600-6706W | Film Layer Analysis Software TN-A160 | Precision Etching and Coating System GAT-682 | | 2001 vintage.
  • JEOL: JSM 6600F

    Details
    ID#:
    196333
    Category:
    Scanning Electron M...
    Field emission microscope | Does not have EDS.
  • JEOL: JSM 6300F

    Details
    ID#:
    116159
    Category:
    Scanning Electron M...
    field emission SEM | Capability: up to 500,000x, 0.5 to 30kV | Includes: | Console | Gun assembly | Mechanical pump | Bake unit.
  • JEOL: JSM 5600

    Details
    ID#:
    151009
    Category:
    Scanning Electron M...
    Analysis SEM.
  • JEOL: JSM 6340F

    Details
    ID#:
    194643
    Category:
    Scanning Electron M...
    SEMs.
  • JEOL: JSM-6330F

    Details
    ID#:
    9041540
    Category:
    Scanning Electron M...
    Field emission microscope | Oxford INCA 250 EDS system | Field emission | 1997 vintage.
  • JEOL: JSM-5800

    Details
    ID#:
    139184
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 6600F

    Details
    ID#:
    194237
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6100

    Details
    ID#:
    43026
    Category:
    Scanning Electron M...
    Vintage:
    1995 
    SEM and Oxford Instruments | Secondary and backscattered electron detectors on SEM | 40 Angstrom image resolution at 8-mm | 10x - 300,000x magnification | 6 inch load-lock chamber door | 0.3-30 kV tungsten gun | Motorized 40 mm x 100 mm specimen stage movement; tilt; rotation | Image storage and retrieval system on SEM | | Oxford Instruments ISIS energy dispersive X-ray spectroscopy system: | Digital pulse processor | Windows 2000 PC-based | Digital image collection | Line scanning | Elemental dot mapping | | If turned too fast, magnification knob sometimes skips a setting | All magnifications achievable | | Configured with a pulse processed ISIS 300 box and an INCA detector | INCA detector reports NIST reference material within ±3% of their actual values per calibration history | | ISIS box: ~1997 vintage | SEM: 1995 vintage.
  • JEOL: JSM 840

    Details
    ID#:
    9026712
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 6510

    Details
    ID#:
    190127
    Category:
    Scanning Electron M...
    Vintage:
    2010 
    Scanning electron microscope | | Automatic focus, contras and brightness functions | Integrated EDX | Sample size up to 6" | Eucentric sample stage | Smart settings for common samples | Individually configurable toolbars for repetitive functional processes | Live imagine with up to 4 detectors simultaneously | Mixing of different detector signals | Built-in video recording (.avi format) | Rotary vane pump | Oil diffusion pump | | Accelerating voltage: 0.5 kV to 30 kV | SE image resolution: 3 nm at 30 kV, 15 nm at 1 kV | Magnification: 5x to 300x | | Samples stage travels (LGS type) x 80 mm | Y: 40 mm | Z: 6 to 45 mm | T: -10 to 90° | R: 360° | | De-installed and stored in a warehouse | 2010 vintage.
  • JEOL: JSM 6700F

    Details
    ID#:
    61580
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | High resolution with a cold field emission source | Use range: 0.5 - 30 kV with a resolution of 1.2nm at 15 kV and 2.5nm at 1 kV | A secondary electron detector is integrated into the bore of the lens and the specimen can be brought up into the lens field | Working distance: as low as 2mm | Second conventional secondary electron detector, which gives more topographic images | Magnifications of 25x to 650,000x (at 8mm working distance) | Digital imaging system is optional | EDX system is optional.
  • JEOL: JSM 6320F

    Details
    ID#:
    96311
    Category:
    Scanning Electron M...
    FE Scanning Electron Microscope, parts system.
  • JEOL: JSM 6700F + Alto Gatan 2500

    Details
    ID#:
    46262
    Category:
    Scanning Electron M...
    Wafer Size:
    8" 
    Vintage:
    2006 
    SEM, 8" | Comes with full accessories as well as an UNUSED Gatan Alto 2500 Cryo transfer system (2003 vintage) for wet samples | Decommissioned by OEM and stored in a clean temp controlled warehouse | Includes all specimen holders, high end HP computer hardware and many related software | The only requirement is a nitrogen source, either from bottled cylinder or produced by a N2 generator | 2006 vintage.
  • JEOL: JSM 6340F

    Details
    ID#:
    145143
    Category:
    Scanning Electron M...
    Wafer Size:
    4" 
    Scanning electron microscope, 4" | Specifications: | In-lens secondary electron detector | Resolution: 2.5nm at 1kV, 1.2nm at 20kV | Sample size: 4" maximum | X-direction: 50mm | Y-direction: 70mm | Chamber has 4" airlock and LN2 cold trap | EDX capabilities (does not include software) | Chamber camera and monitor to view interior of chamber | X-Stream imaging system | Windows XP for image capture and networking capability.
  • JEOL: JSM 6320F

    Details
    ID#:
    78459
    Category:
    Scanning Electron M...
    FE Scanning Electron Microscope | Electromagnetic | 2-Stage deflection | De-installed | Not operational.
  • JEOL: JSM 35

    Details
    ID#:
    145708
    Category:
    Scanning Electron M...
    SEM, parts system.
  • JEOL: JSM 5610

    Details
    ID#:
    142847
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope | Specifications: | Resolution (high vacuum mode): 3.5nm | Accelerating voltage: x0.5 to 30kV (53 steps) | Images: SEI, BEI (COMPO, TOPO, Shadow) | Magnification: 18x to 300,000x (in 136 steps) | Specimen size: less than 6" | Specimen stage: | Eucentric goniometer | X: 80mm | Y: 40mm | Z: 5 to 48mm | Tilt: -10° to 90° | Rotation: 360° | Electron gun: W filament | Gun bias: automatically settable for all accelerating voltages | Image shift: +12 micrometer or -12 micrometer | Displayed image: 640 x 480 pixels | Analytical functions: OXFORD ISIS EDS system | Detectable element range: 5B to 92U | Problem with (1) PCB on INCA 300 EDS | (2) Diodes need to be replaced | 2002 vintage.
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