JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System | Rotary pump | Power supply.
  • JEOL: JSM 6390

    Details
    ID#:
    9161624
    Category:
    Scanning Electron M...
    Vintage:
    2008 
    Scanning electron microscope (SEM) | Tungsten | SE Detector | Resolution: 3.0nm (30kV) | Accelerating voltage: 0.5 to 30kV | Maximum magnification: 300,000 x | Tungsten filament (W) | Objective lens: Super conical lens | Objective lens apertures: Three position, controllable in X/Y directions | Rotary pump | ATC Chiller 1.5kW | Diffusion pump (to be confirmed) | Software version : JEOL TR0114-020 Version 8.24 | Specimen stage: | 5 Axis cartesian stage | X= 80mm Y=40mm Z= 5mm R= 360° (endless) T= -10/90° | Computer controlled 3 axis motor drive | X Y R Motorized | T Z Manual | Display: 20" LCD | Currently warehoused | 2008 vintage.
  • JEOL: JSM 6490LV

    Details
    ID#:
    9123092
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX EDS | PC System with JSM-6490LV software | PC with Noran software | Mechanical Pump | Flanges | Cables | Replacement cartridges | (2) Chiller boxes | Noran cables | Interface box with cables | Differential pump water hose | Low vacuum pipe | Tractor unit | RP filters | LV Pinami gauge | LN2 sensor | | Resolution: | -High vacuum mode: 3.0 nm (30 kV) | -Low vacuum mode: 4.0 nm (30 kV) | Accelerating voltage: 0.3 to 30 kV | Magnification: 5x to 300,000x | Filament: pre-centered W hairpin filament with continuous auto bias | Objective lens: super conical | Objective lens apertures: click-stop type (3-stop variable); fine position controllable with X-Y directions | Maximum specimen size: 8" coverage, 12" specimen can be loaded | Specimen state: 5-axis computer controller eucentric goniometer; X 125 mm, Y 100 mm, Z 5 to 80 mm, T -10 to 90°, R 360° endless | Vacuum mode changeover: automatic (PC interface controlled) | | EDAX: | Model: PV77-57810-ME | Active area: 10 mm2 | Amplifier model: 204 B+ | Window type: super ultra-thin window (SUTW) | Resolution: <132 eV @ MnKa @ 1 Kcps | Insertion / retraction: manual.
  • JEOL: JSM 6340F

    Details
    ID#:
    9003281
    Category:
    Scanning Electron M...
    SEM | | Specifications:   | | a. Performance | SEI Resolution : 1.2 nm guaranteed (Acc. V. = 15kV) | 2.5 nm guaranteed (Acc. V. = 1kV) | Magnification : x 25 (WD 25 mm) to x 650,000 | Accelerating Voltage : 0.5 to 2.9 kV (10 V steps) | 2.9 to 30 kV (100 V steps) | Probe Current : 2 x 10-9 to 10-13 A | Image Mode : SEI, LEI |   | b. Electron Optical System | Electron Gun : High-resolution Conical Anode Field Emission Gun with Cold Cathode | Alignment : Mechanical and Electromagnetic Deflection | Condenser lens (C.L.) : Electromagnetic 2-stage zoom lens | Objective lens (O.L.) : Superconical CF (corrected field) lens | O.L. Apertures : Variable, 4-step click-stop type |   | c. Specimen Stage | Type : Fully Eccentric Goniometer | Movement :  X = 50mm, Y = 70mm, Z = 23mm | Tilt = -5* to +45* | Rotation = 360* endless (motor driven) | Motorized movement for all 5 axes |   | d. Specimen Chamber | Max Specimen size : 100mm or 4inch diameter | Specimen Exchange: Airlock type (100mm dia. or less) | EDS Detector : WD = 15 mm | Take-off Angle = 20* |   | e. Display System | Display Tubes | Observation: One, 17-inch color CRT | Recording : One, 5-inch ultra high resolution short-persistence CRT | Scanning Modes : PIC (Full, ½ & ¼ frame), Bright-up, line Profile, Spot | Display Modes : NORM, WFM, D-MAG, YZ Mod, FREZ, DUAL Display, Different magnification Images | Auto Functions : Auto Focus, Auto Astigmatism Correction, Auto Contrast & Brightness | Image Memory : 1280 x 1024 x 8 bits.
  • JEOL: JSM-6000

    Details
    ID#:
    9135789
    Category:
    Scanning Electron M...
    Vintage:
    2000 
    SEM, | 2000 vintage.
  • JEOL: JSM 5600LV

    Details
    ID#:
    9136181
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 6320F

    Details
    ID#:
    9134048
    Category:
    Scanning Electron M...
    Wafer Size:
    8" 
    Scanning electron microscope, 8".
  • JEOL: JSM 5410

    Details
    ID#:
    9003522
    Category:
    Scanning Electron M...
    Scanning electron microscope | Application for SEM, EDS, SemAfore, Sputter Coater | Currently installed in a lab.
  • JEOL: JSM 700

    Details
    ID#:
    9103835
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5610

    Details
    ID#:
    9008606
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope | Resolution (high vacuum mode): 3.5nm (3.5nm@Acc.volt30kv,WD6mm) | Accelerating voltage: x0.5 to 30kV (53 steps) | Images: SEI, BEI (COMPO, TOPO, Shadow) | Magnification: 18(18x@WD48)x to 300,000x (in 136 steps) | Specimen size: less than 6" | Specimen stage: | Eucentric goniometer | X: 80mm | Y: 40mm | Z: 5 to 48mm | Tilt: -10° to 90° | Rotation: 360° | Electron gun: W filament | Gun bias: automatically settable for all accelerating voltages | Image shift: +12 micrometer or -12 micrometer | Displayed image: 640 x 480 pixels(640×480, 1280×960pixels) | Analytical functions: OXFORD ISIS EDS system | Detectable element range: 5B to 92U | Backscatter | EDS | 2002 vintage.
  • JEOL: JSM 5600LV

    Details
    ID#:
    9005306
    Category:
    Scanning Electron M...
    FE-SEM, with EDX and fine coater.
  • JEOL: JSM 6300 V

    Details
    ID#:
    9098216
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
  • JEOL: JSM T330A

    Details
    ID#:
    9003668
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6100

    Details
    ID#:
    201085
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM) | 200 VAC, 15A, 1 phase, 50/60 Hz, 3 kVA.
  • JEOL: JSM 6300V

    Details
    ID#:
    9016383
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 6600FXV

    Details
    ID#:
    9098215
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
  • JEOL: JSM 6600

    Details
    ID#:
    177690
    Category:
    Scanning Electron M...
    Scanning electron microscope, 6" | | Specifications: | Includes EDX option | 200VAC, 1 phase, 30A, 50/60Hz, 6KVA | Secondary electron image resolution (at 8mm working distance): at 35kV 3.5nm guaranteed and at 1kV 20.0nm attainable | Magnification: 10x to 300'000x | Accelerating voltage: 0.2 to 40kV (0.2 to 5kV variable in 0.1kV steps, 5 to 40kV variable in 1kV steps) | | 1990 vintage.
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