JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System | Rotary pump | Power supply.
  • JEOL: JSM 6490LV

    Details
    ID#:
    9123092
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX EDS | PC System with JSM-6490LV software | PC with Noran software | Mechanical Pump | Flanges | Cables | Replacement cartridges | (2) Chiller boxes | Noran cables | Interface box with cables | Differential pump water hose | Low vacuum pipe | Tractor unit | RP filters | LV Pinami gauge | LN2 sensor | | Resolution: | -High vacuum mode: 3.0 nm (30 kV) | -Low vacuum mode: 4.0 nm (30 kV) | Accelerating voltage: 0.3 to 30 kV | Magnification: 5x to 300,000x | Filament: pre-centered W hairpin filament with continuous auto bias | Objective lens: super conical | Objective lens apertures: click-stop type (3-stop variable); fine position controllable with X-Y directions | Maximum specimen size: 8" coverage, 12" specimen can be loaded | Specimen state: 5-axis computer controller eucentric goniometer; X 125 mm, Y 100 mm, Z 5 to 80 mm, T -10 to 90°, R 360° endless | Vacuum mode changeover: automatic (PC interface controlled) | | EDAX: | Model: PV77-57810-ME | Active area: 10 mm2 | Amplifier model: 204 B+ | Window type: super ultra-thin window (SUTW) | Resolution: <132 eV @ MnKa @ 1 Kcps | Insertion / retraction: manual.
  • JEOL: JSM 5400

    Details
    ID#:
    9079563
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM T220A

    Details
    ID#:
    9137361
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6300V

    Details
    ID#:
    9016383
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 840

    Details
    ID#:
    9102733
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5610

    Details
    ID#:
    9008606
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope | Resolution (high vacuum mode): 3.5nm (3.5nm@Acc.volt30kv,WD6mm) | Accelerating voltage: x0.5 to 30kV (53 steps) | Images: SEI, BEI (COMPO, TOPO, Shadow) | Magnification: 18(18x@WD48)x to 300,000x (in 136 steps) | Specimen size: less than 6" | Specimen stage: | Eucentric goniometer | X: 80mm | Y: 40mm | Z: 5 to 48mm | Tilt: -10° to 90° | Rotation: 360° | Electron gun: W filament | Gun bias: automatically settable for all accelerating voltages | Image shift: +12 micrometer or -12 micrometer | Displayed image: 640 x 480 pixels(640×480, 1280×960pixels) | Analytical functions: OXFORD ISIS EDS system | Detectable element range: 5B to 92U | Backscatter | EDS | 2002 vintage.
  • JEOL: JSM-5800VP

    Details
    ID#:
    9096225
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Turbo pump | | Optional: | EDS | WDS.
  • JEOL: JSM 6360

    Details
    ID#:
    179578
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6600

    Details
    ID#:
    9136256
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | | Spare Parts: | (1) Extender MP001569-01 | (1) Extender AP002139(00) | (1) VACUUM CONTROLLER AP001129-01 | (1) MAG PWRAMP 152048-1/1 | (1) PS RGLTR CCT 1 SM151003 | (1) CRT PAT 1520048-1/1 | (1) PA RGLTR CCT 2 1520048-1/1 | (1) SPECIMEN CURRENT AMPLIFIER TYPE 103B | (1) PCSM-PCD40D EP380131 | (1) EVTH DETECTOR PMT | (14) WEHNELT ASSEMBLY 804302090 | (6) WEHNELT ASSEMBLY /W LaB6 804302090 | (3) WEHNELT ASSEMBLY /W LaB6 804302090 | (2) WEHNELT ASSEMBLY /W LaB6 804302090 | (1) WEHNELT ASSEMBLY /W LaB6 804302090 | (2) ANODES | (5) TOOLS | (1) SILICON WAFER HOLDER 8 1/4" W/5 50MM LOCATIONS | (1) SILICON WAFER HOLDER 6 1/4" W/5 40MM LOCATIONS | (2) SILICON WAFER HOLDER 5 1/4" W/5 25MM LOCATIONS. |
  • JEOL: JSM-5800

    Details
    ID#:
    9021406
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | with Oxford 5431 EDS/EDAX unit | Backscatter option installed | PC not included | Non-operational.
  • JEOL: JSM 6340F

    Details
    ID#:
    9052725
    Category:
    Scanning Electron M...
    CD Scanning electron microscope, (CD-SEM).
  • JEOL: JSM 6300

    Details
    ID#:
    9134806
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Dell PC, Win98 OS, Vision software, Spirit software | PGT Si (Li) UTW | Tungsten (W) Filament | | Detectors: | - E-T | - BSE | - EDS- PGT Si(Li) detector for microanalysis | | Stage details: X-Y motor | Stage travel: XYZ mm 50, 70, 40 | Image pixel size (max.): 1024x1024.
  • JEOL: JSM 840A

    Details
    ID#:
    9102734
    Category:
    Scanning Electron M...
    Vintage:
    1983 
    Scanning electron microscope (SEM), 1983 vintage.
  • JEOL: JSM 5600LV

    Details
    ID#:
    9005306
    Category:
    Scanning Electron M...
    FE-SEM, with EDX and fine coater.
  • JEOL: JSM T330A

    Details
    ID#:
    9003668
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 5600LV

    Details
    ID#:
    9136181
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
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