JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System | Rotary pump | Power supply.
  • JEOL: JSM 6490LV

    Details
    ID#:
    9123092
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX EDS | PC System with JSM-6490LV software | PC with Noran software | Mechanical Pump | Flanges | Cables | Replacement cartridges | (2) Chiller boxes | Noran cables | Interface box with cables | Differential pump water hose | Low vacuum pipe | Tractor unit | RP filters | LV Pinami gauge | LN2 sensor | | Resolution: | -High vacuum mode: 3.0 nm (30 kV) | -Low vacuum mode: 4.0 nm (30 kV) | Accelerating voltage: 0.3 to 30 kV | Magnification: 5x to 300,000x | Filament: pre-centered W hairpin filament with continuous auto bias | Objective lens: super conical | Objective lens apertures: click-stop type (3-stop variable); fine position controllable with X-Y directions | Maximum specimen size: 8" coverage, 12" specimen can be loaded | Specimen state: 5-axis computer controller eucentric goniometer; X 125 mm, Y 100 mm, Z 5 to 80 mm, T -10 to 90°, R 360° endless | Vacuum mode changeover: automatic (PC interface controlled) | | EDAX: | Model: PV77-57810-ME | Active area: 10 mm2 | Amplifier model: 204 B+ | Window type: super ultra-thin window (SUTW) | Resolution: <132 eV @ MnKa @ 1 Kcps | Insertion / retraction: manual.
  • JEOL: JSM 6600F

    Details
    ID#:
    9035051
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 5900LV

    Details
    ID#:
    9123096
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM) | Variable pressure | Turbo pump | Available options: EDX with SDD or EDAX with Si (Li).
  • JEOL: JSM 6600

    Details
    ID#:
    9122948
    Category:
    Scanning Electron M...
    Scanning microscope | EDX option.
  • JEOL: JSM 840

    Details
    ID#:
    9037607
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM IC848A

    Details
    ID#:
    9039276
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) with EDS, 6" | | Includes: | Full element analysis capability | Large chamber design, 150 mm samples | Load lock | Full scanning in X and Y axis | Observation of 10 nm or less | Thermo Noran EDS detector (mounted) | No software or other hardware | | Accelerating voltage: | 0.2 to 40 kV (linked with bias, lens currents, and coil currents) | | Magnification: | 10x (at 39mm working distance) to 300,000x | 100x (fixed) | | Speciment movment rage: | X-direction: 160mm | Y-direction: 160mm | Z-direction: 38mm | Tilt : 0 to 60 degree | | Specimen exchange: | By airlock: Up to 204mm dia. specimen holders | By stage drawout: Available | | Speciment holder: | 12.5mm dia. x 10mm H specimens (height adjustable) | 102mm dia. x 0.5mm H specimens | 153mm dia. x 1mm H specimens | 204mm dia x 1mm H specimens.
  • JEOL: JSM 6600

    Details
    ID#:
    9035050
    Category:
    Scanning Electron M...
    Wafer Size:
    6" 
    Vintage:
    1990 
    SEM with EDX option, 6" | | Secondary electron image resolution at 8 mm | At 35 kV: 3.5 nm | At 1 kV: 20.0 nm | | Backscattered electron image resolution at 8 mm | At 35 kV: 10.0 nm | | Magnification | Zoom mode: 10 - 300,000x | Fixed mode: Any magnification can be set | | Probe current: 10^(-12) to 10^(-5) Amps | | Currently installed and powered down | 1990 vintage.
  • JEOL: JSM 6340F

    Details
    ID#:
    9052725
    Category:
    Scanning Electron M...
    CD Scanning electron microscope, (CD-SEM).
  • JEOL: JSM 7400F

    Details
    ID#:
    9109498
    Category:
    Scanning Electron M...
    Field Emission Scanning Electron Microscope (FE-SEM).
  • JEOL: JSM 5600

    Details
    ID#:
    9052724
    Category:
    Scanning Electron M...
    CD SEM.
  • JEOL: JSM 6340F

    Details
    ID#:
    9118809
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM-6330F

    Details
    ID#:
    9041540
    Category:
    Scanning Electron M...
    Field emission microscope | Oxford INCA 250 EDS system | Includes Oxford EDX | 1997 vintage.
  • JEOL: JSM 5200

    Details
    ID#:
    9119073
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Stand alone | Operator console | Manuals.
  • JEOL: JSM 6400F

    Details
    ID#:
    9119070
    Category:
    Scanning Electron M...
    Cold field emission SEM, 8" | Load lock, 8" | Column | Operator console | SIP PS | Pumps | Computer and monitors | Vibration table.
  • JEOL: JSM-5600

    Details
    ID#:
    9125313
    Category:
    Scanning Electron M...
  • JEOL: JSM 6330F

    Details
    ID#:
    9109202
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
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