JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 7500

    Details
    ID#:
    9055561
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 7001FLV

    Details
    ID#:
    9047148
    Category:
    Scanning Electron M...
    SEM scanning electron microscope | Magnification Range: 10X to 1,000,000X.
  • JEOL: JSM 7400F

    Details
    ID#:
    9097820
    Category:
    Scanning Electron M...
    Field Emission Scanning Electron Microscope (FE-SEM).
  • JEOL: JSM 6100

    Details
    ID#:
    43026
    Category:
    Scanning Electron M...
    Vintage:
    1995 
    SEM and Oxford Instruments | Secondary and backscattered electron detectors on SEM | 40 Angstrom image resolution at 8-mm | 10x - 300,000x magnification | 6 inch load-lock chamber door | 0.3-30 kV tungsten gun | Motorized 40 mm x 100 mm specimen stage movement; tilt; rotation | Image storage and retrieval system on SEM | | Oxford Instruments ISIS energy dispersive X-ray spectroscopy system: | Digital pulse processor | Windows 2000 PC-based | Digital image collection | Line scanning | Elemental dot mapping | | If turned too fast, magnification knob sometimes skips a setting | All magnifications achievable | | Configured with a pulse processed ISIS 300 box and an INCA detector | INCA detector reports NIST reference material within ±3% of their actual values per calibration history | | ISIS box: ~1997 vintage | SEM: 1995 vintage.
  • JEOL: JSM T330A

    Details
    ID#:
    9069334
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Includes EDS.
  • JEOL: JSM 6401F

    Details
    ID#:
    9065984
    Category:
    Scanning Electron M...
    SEM/EDX | Includes vacuum pump and chiller unit.
  • JEOL: JSM 5910LV

    Details
    ID#:
    9079276
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope (SEM) | High vacuum mode: resolution: 3.0nm LV cooling | Magnification: x18 ~ 300,000 | Image: secondary electron image and reflected electron image | Low vacuum mode: Resolution: 4.5nm | Image: backscattered electron image | Input: 1φ100V 50 / 60Hz 3KVA | Cooling water: 2L / min | 2002 vintage.
  • JEOL: JSM 6600F

    Details
    ID#:
    9035051
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 6700F + Alto Gatan 2500

    Details
    ID#:
    46262
    Category:
    Scanning Electron M...
    Wafer Size:
    8" 
    Vintage:
    2006 
    SEM, 8" | Comes with full accessories as well as an UNUSED Gatan Alto 2500 Cryo transfer system (2003 vintage) for wet samples | Decommissioned by OEM and stored in a clean temp controlled warehouse | Includes all specimen holders, high end HP computer hardware and many related software | The only requirement is a nitrogen source, either from bottled cylinder or produced by a N2 generator | 2006 vintage.
  • JEOL: JSM 6340F

    Details
    ID#:
    9013669
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope (FESEM) | Oxford 7158 INCA Microanalysis system | JEOL stage controller | PC, monitor, HP Vectra Pentium 3 CPU | Windows NT 98 | HP Laser printer | Exela Cool Ace model CA-2500 cooling unit | Large chamber.
  • JEOL: JSM-5800

    Details
    ID#:
    9021406
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | with Oxford 5431 EDS/EDAX unit | Backscatter option installed | PC not included | Non-operational.
  • JEOL: JSM 6600F

    Details
    ID#:
    196333
    Category:
    Scanning Electron M...
    Field emission microscope | Does not have EDS.
  • JEOL: JSM 5200

    Details
    ID#:
    9082752
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6300F

    Details
    ID#:
    53576
    Category:
    Scanning Electron M...
    FE SEM.
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