JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9040833
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | 1990 vintage.
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 6100

    Details
    ID#:
    43026
    Category:
    Scanning Electron M...
    Vintage:
    1995 
    SEM and Oxford Instruments | Secondary and backscattered electron detectors on SEM | 40 Angstrom image resolution at 8-mm | 10x - 300,000x magnification | 6 inch load-lock chamber door | 0.3-30 kV tungsten gun | Motorized 40 mm x 100 mm specimen stage movement; tilt; rotation | Image storage and retrieval system on SEM | | Oxford Instruments ISIS energy dispersive X-ray spectroscopy system: | Digital pulse processor | Windows 2000 PC-based | Digital image collection | Line scanning | Elemental dot mapping | | If turned too fast, magnification knob sometimes skips a setting | All magnifications achievable | | Configured with a pulse processed ISIS 300 box and an INCA detector | INCA detector reports NIST reference material within ±3% of their actual values per calibration history | | ISIS box: ~1997 vintage | SEM: 1995 vintage.
  • JEOL: JSM 6600

    Details
    ID#:
    177690
    Category:
    Scanning Electron M...
    Scanning electron microscope | | Specifications: | Includes EDX option | 200VAC, 1 phase, 30A, 50/60Hz, 6KVA | Secondary electron image resolution (at 8mm working distance): at 35kV 3.5nm guaranteed and at 1kV 20.0nm attainable | Magnification: 10x to 300'000x | Accelerating voltage: 0.2 to 40kV (0.2 to 5kV variable in 0.1kV steps, 5 to 40kV variable in 1kV steps) | | 1990 vintage.
  • JEOL: JSM 6700F + Alto Gatan 2500

    Details
    ID#:
    46262
    Category:
    Scanning Electron M...
    Wafer Size:
    8" 
    Vintage:
    2006 
    SEM, 8" | Comes with full accessories as well as an UNUSED Gatan Alto 2500 Cryo transfer system (2003 vintage) for wet samples | Decommissioned by OEM and stored in a clean temp controlled warehouse | Includes all specimen holders, high end HP computer hardware and many related software | The only requirement is a nitrogen source, either from bottled cylinder or produced by a N2 generator | 2006 vintage.
  • JEOL: JSM IC848A

    Details
    ID#:
    9039276
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) with EDS, 6" | | Includes: | Full element analysis capability | Large chamber design, 150 mm samples | Load lock | Full scanning in X and Y axis | Observation of 10 nm or less | Thermo Noran EDS detector (mounted) | No software or other hardware | | Accelerating voltage: | 0.2 to 40 kV (linked with bias, lens currents, and coil currents) | | Magnification: | 10x (at 39mm working distance) to 300,000x | 100x (fixed) | | Speciment movment rage: | X-direction: 160mm | Y-direction: 160mm | Z-direction: 38mm | Tilt : 0 to 60 degree | | Specimen exchange: | By airlock: Up to 204mm dia. specimen holders | By stage drawout: Available | | Speciment holder: | 12.5mm dia. x 10mm H specimens (height adjustable) | 102mm dia. x 0.5mm H specimens | 153mm dia. x 1mm H specimens | 204mm dia x 1mm H specimens.
  • JEOL: JSM 6510

    Details
    ID#:
    190127
    Category:
    Scanning Electron M...
    Vintage:
    2010 
    Scanning electron microscope | | Automatic focus, contras and brightness functions | Integrated EDX | Sample size up to 6" | Eucentric sample stage | Smart settings for common samples | Individually configurable toolbars for repetitive functional processes | Live imagine with up to 4 detectors simultaneously | Mixing of different detector signals | Built-in video recording (.avi format) | Rotary vane pump | Oil diffusion pump | | Accelerating voltage: 0.5 kV to 30 kV | SE image resolution: 3 nm at 30 kV, 15 nm at 1 kV | Magnification: 5x to 300x | | Samples stage travels (LGS type) x 80 mm | Y: 40 mm | Z: 6 to 45 mm | T: -10 to 90° | R: 360° | | De-installed and stored in a warehouse | 2010 vintage.
  • JEOL: JSM 6360

    Details
    ID#:
    179578
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM-6330F

    Details
    ID#:
    9041540
    Category:
    Scanning Electron M...
    Field emission microscope | Oxford INCA 250 EDS system | Field emission | 1997 vintage.
  • JEOL: JSM 6320F

    Details
    ID#:
    96311
    Category:
    Scanning Electron M...
    FE Scanning Electron Microscope, parts system.
  • JEOL: JSM 820

    Details
    ID#:
    190290
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | (2) Power supplies | Chiller.
  • JEOL: JSM 6400F

    Details
    ID#:
    126936
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5600

    Details
    ID#:
    9052724
    Category:
    Scanning Electron M...
    CD SEM.
  • JEOL: JSM 6340F

    Details
    ID#:
    9052725
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 6300F

    Details
    ID#:
    127276
    Category:
    Scanning Electron M...
    Field emission SEM | De-installed 2003 | Crated.
  • JEOL: JSM IC848

    Details
    ID#:
    93872
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6300F

    Details
    ID#:
    53576
    Category:
    Scanning Electron M...
    FE SEM.
  • JEOL: JSM 6300F

    Details
    ID#:
    116159
    Category:
    Scanning Electron M...
    field emission SEM | Capability: up to 500,000x, 0.5 to 30kV | Includes: | Console | Gun assembly | Mechanical pump | Bake unit.
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