JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 6600

    Details
    ID#:
    9035050
    Category:
    Scanning Electron M...
    Wafer Size:
    6" 
    Vintage:
    1990 
    SEM with EDX option, 6" | | Secondary electron image resolution at 8 mm | At 35 kV: 3.5 nm | At 1 kV: 20.0 nm | | Backscattered electron image resolution at 8 mm | At 35 kV: 10.0 nm | | Magnification | Zoom mode: 10 - 300,000x | Fixed mode: Any magnification can be set | | Probe current: 10^(-12) to 10^(-5) Amps | | Currently installed and powered down | 1990 vintage.
  • JEOL: JSM 6600F

    Details
    ID#:
    9035051
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM IC848A

    Details
    ID#:
    9039276
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) with EDS, 6" | | Includes: | Full element analysis capability | Large chamber design, 150 mm samples | Load lock | Full scanning in X and Y axis | Observation of 10 nm or less | Thermo Noran EDS detector (mounted) | No software or other hardware | | Accelerating voltage: | 0.2 to 40 kV (linked with bias, lens currents, and coil currents) | | Magnification: | 10x (at 39mm working distance) to 300,000x | 100x (fixed) | | Speciment movment rage: | X-direction: 160mm | Y-direction: 160mm | Z-direction: 38mm | Tilt : 0 to 60 degree | | Specimen exchange: | By airlock: Up to 204mm dia. specimen holders | By stage drawout: Available | | Speciment holder: | 12.5mm dia. x 10mm H specimens (height adjustable) | 102mm dia. x 0.5mm H specimens | 153mm dia. x 1mm H specimens | 204mm dia x 1mm H specimens.
  • JEOL: JSM-6330F

    Details
    ID#:
    9041540
    Category:
    Scanning Electron M...
    Field emission microscope | Oxford INCA 250 EDS system | Field emission | 1997 vintage.
  • JEOL: JSM 5610LV

    Details
    ID#:
    9033103
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6360

    Details
    ID#:
    9032379
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Currently in a lab.
  • JEOL: JSM 6300V

    Details
    ID#:
    9016383
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM-5800

    Details
    ID#:
    9021406
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | with Oxford 5431 EDS/EDAX unit | Backscatter option installed | PC not included | Non-operational.
  • JEOL: JSM 6340F

    Details
    ID#:
    9013669
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope (FESEM) | Oxford 7158 INCA Microanalysis system | JEOL stage controller | PC, monitor, HP Vectra Pentium 3 CPU | Windows NT 98 | HP Laser printer | Exela Cool Ace model CA-2500 cooling unit | Large chamber.
  • JEOL: JSM 7001FLV

    Details
    ID#:
    9047148
    Category:
    Scanning Electron M...
    SEM scanning electron microscope | Magnification Range: 10X to 1,000,000X.
  • JEOL: JSM 6390LV

    Details
    ID#:
    9029909
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Resolution: High Vacuum mode: 3.0 nm(30kV). Low Vacuum mode: 4.0 nm(30kV) | Accelerating voltage: 0.5 to 30 kV | Magnification: x5 to 300,000 | Filament: Pre-centered W hairpin filament (with continuous auto bias) | Objective lens: Super conical lens | Objective lens apertures: Three position, controllable in X/Y directions | | Maximum specimen size: | GS Type stage: 32mm full coverage | LGS Type stage: 5" full coverage (152.4mm dia. loadable) | | Specimen stage: | GS Type stage: | Eucentric goniometer | X=20mm, Y=10mm, Z=5mm-48mm | R=360° (endless) | Tilt -10/+90° | | LGS Type stage Eucentric goniometer: | X=80mm, Y=40mm, Z=5mm-48mm | R=360° (endless) | Tilt -10/+90° | (Computer controlled 2, 3 or 5 axis motor drive: option) | | Display LCD: 20 inch, high resolution FPD | | 2010 vintage.
  • JEOL: JSM 7500

    Details
    ID#:
    9055561
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5600

    Details
    ID#:
    9052724
    Category:
    Scanning Electron M...
    CD SEM.
  • JEOL: JSM-5900LV

    Details
    ID#:
    9064221
    Category:
    Scanning Electron M...
    Vintage:
    2000 
    Variable pressure SEM, 6" | 6" wafer capable, can insert 6" sample | Specimen stage: fully automatic 5-axis 8" | Chamber for large specimens | Oxford EDS system | BSE detector | Resolution specifications: for the SE 3 nm at 30 kV; 5 nm at 30 kV for the BSE | Pressure: adjustable; 10 to 270 Pa, 3nm reso preferred | Specimen stage: X-movement: 125mm, Y-movement: 100mm, Z-movement: 43mm, Tilt: -10 to + 90º, Rotation: 360º | Specimen size: 8" diameter loadable, 7" diameter full coverage with rotation | Tungsten preferred but not mandatory | 2000 vintage.
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