JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System | Rotary pump | Power supply.
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 6490LV

    Details
    ID#:
    9123092
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX EDS | PC System with JSM-6490LV software | PC with Noran software | Mechanical Pump | Flanges | Cables | Replacement cartridges | (2) Chiller boxes | Noran cables | Interface box with cables | Differential pump water hose | Low vacuum pipe | Tractor unit | RP filters | LV Pinami gauge | LN2 sensor | | Resolution: | -High vacuum mode: 3.0 nm (30 kV) | -Low vacuum mode: 4.0 nm (30 kV) | Accelerating voltage: 0.3 to 30 kV | Magnification: 5x to 300,000x | Filament: pre-centered W hairpin filament with continuous auto bias | Objective lens: super conical | Objective lens apertures: click-stop type (3-stop variable); fine position controllable with X-Y directions | Maximum specimen size: 8" coverage, 12" specimen can be loaded | Specimen state: 5-axis computer controller eucentric goniometer; X 125 mm, Y 100 mm, Z 5 to 80 mm, T -10 to 90°, R 360° endless | Vacuum mode changeover: automatic (PC interface controlled) | | EDAX: | Model: PV77-57810-ME | Active area: 10 mm2 | Amplifier model: 204 B+ | Window type: super ultra-thin window (SUTW) | Resolution: <132 eV @ MnKa @ 1 Kcps | Insertion / retraction: manual.
  • JEOL: JSM 6060LV

    Details
    ID#:
    9103750
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 5900LV

    Details
    ID#:
    9103753
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6060LV

    Details
    ID#:
    9103751
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 700D

    Details
    ID#:
    9103836
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 700

    Details
    ID#:
    9103835
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6390LV

    Details
    ID#:
    9103749
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 5500

    Details
    ID#:
    9103747
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6390LV

    Details
    ID#:
    9029909
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Resolution: High Vacuum mode: 3.0 nm(30kV). Low Vacuum mode: 4.0 nm(30kV) | Accelerating voltage: 0.5 to 30 kV | Magnification: x5 to 300,000 | Filament: Pre-centered W hairpin filament (with continuous auto bias) | Objective lens: Super conical lens | Objective lens apertures: Three position, controllable in X/Y directions | | Maximum specimen size: | GS Type stage: 32mm full coverage | LGS Type stage: 5" full coverage (152.4mm dia. loadable) | | Specimen stage: | GS Type stage: | Eucentric goniometer | X=20mm, Y=10mm, Z=5mm-48mm | R=360° (endless) | Tilt -10/+90° | | LGS Type stage Eucentric goniometer: | X=80mm, Y=40mm, Z=5mm-48mm | R=360° (endless) | Tilt -10/+90° | (Computer controlled 2, 3 or 5 axis motor drive: option) | | Display LCD: 20 inch, high resolution FPD | | 2010 vintage.
  • JEOL: JSM 7400F

    Details
    ID#:
    9097820
    Category:
    Scanning Electron M...
    Field Emission Scanning Electron Microscope (FE-SEM).
  • JEOL: JSM 6600FXV

    Details
    ID#:
    9098215
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
  • JEOL: JSM 6300 V

    Details
    ID#:
    9098216
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
  • JEOL: JSM 840A

    Details
    ID#:
    9102734
    Category:
    Scanning Electron M...
    Vintage:
    1983 
    Scanning electron microscope (SEM), 1983 vintage.
  • JEOL: JSM 840

    Details
    ID#:
    9102733
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400F

    Details
    ID#:
    9102730
    Category:
    Scanning Electron M...
    Vintage:
    1989 
    Scanning electron microscope (SEM), 1989 vintage.
Copyright © 2011 Capital Asset Exchange & Trading LLC. Tous droits réservés.