JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 6010LA

    Details
    ID#:
    9080849
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | | Equipped with: | Energy Dispersive Spectroscopy (EDS) | Silicon Drift Detector (SDD) | onboard turbo pump | | Resolution High Vacuum mode: 4nm (20kV), 8nm (3kV), 15nm (1kV) | Low Vacuum mode: 5nm (20kV) BSE | Accelerating voltage 500V to 20kV | Magnification x5 to x300,000 (printed as a 128mm x 96mm micrograph) | LV detector Multi-segment BSED (std.) | LV-SED (option) | LV pressure 10 to 100 Pa | Maximum specimen size Observation£º125mm diameter | Loadable 152mm | LGS type stage Eucentric goniometer | X=80mm, Y=40mm, Z=5mm-48mm | R=360¡ã (endless) | Tilt -10/+90¡ã | (Computer-controlled 2 or 3-axis motor drive) | Frame Store Up to 5120¡Á3840 pixels | EDS Standard (LA Version) | Embedded EDS system (silicon drift detector technology) Includes: Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation | Joel JSM-6010LA Microscopes Main Controls | Table Top | Table Base/Power Box | Monitor | Computer | Cords and Cables | Misc Accessories and Parts | Voltage: 100 V | Frequency: 50/60 HERTZ | | InTouchScope function: | High resolution imaging in HV/LV/SE/BSE | Chemical analysis with integrated EDS built (standard on LA model) | Multi-touch screen control and wireless operation | Automatic SEM condition setup based on sample type | Simultaneous multiple live image and movie capture | Fast sample navigation at 5x ¨C 300,000x magnifications.
  • JEOL: JSM T330A

    Details
    ID#:
    116691
    Category:
    Scanning Electron M...
    Scanning Electron Microscope with Tracor Northern Z-Max 30 Series TN5502N EDS System | Resolution: 5nm (SEI, 30kV, WD=10nm) | Magnification: | LGS 15x (WD=48mm) -200,000x | SGZ 35x (WD=38mm)-200,000x | Accelerating voltage: 0.5-30Kv | Cooling water: 2L per minute | Power requirement: 100VAC 1Phase 50/60Hz, 2kVA | Constant Current: 20A, Starting Current: 60A | Tracor Northern Z-Max 30 Series TN-5502N EDS system specifications: | Z-Max 30 Series Model: 98-629I3/54S | Controller Model: TN-5502N Assy.:700P117748 | Laboratory Resolution: 148.6 | Laboratory Peak/BKGD.: 889 | Bias Voltage: -400V | Heater Voltage: 10.0 | Controller Power Requirement: 115VAC 12A or 230VAC 7A.
  • JEOL: JSM 6400F

    Details
    ID#:
    9065264
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | No EDAX.
  • JEOL: JSM 6401F

    Details
    ID#:
    9065984
    Category:
    Scanning Electron M...
    SEM/EDX | Includes vacuum pump and chiller unit.
  • JEOL: JSM-5900LV

    Details
    ID#:
    9064221
    Category:
    Scanning Electron M...
    Vintage:
    2000 
    Variable pressure SEM, 6" | 6" wafer capable, can insert 6" sample | Specimen stage: fully automatic 5-axis 8" | Chamber for large specimens | Oxford EDS system | BSE detector | Resolution specifications: for the SE 3 nm at 30 kV; 5 nm at 30 kV for the BSE | Pressure: adjustable; 10 to 270 Pa, 3nm reso preferred | Specimen stage: X-movement: 125mm, Y-movement: 100mm, Z-movement: 43mm, Tilt: -10 to + 90º, Rotation: 360º | Specimen size: 8" diameter loadable, 7" diameter full coverage with rotation | Tungsten preferred but not mandatory | 2000 vintage.
  • JEOL: JSM 5400

    Details
    ID#:
    9013668
    Category:
    Scanning Electron M...
    Scanning electron microscope | Noran Voyager EDS | Can be demonstrated | 1997 vintage.
  • JEOL: JSM T330A

    Details
    ID#:
    9069334
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Includes EDS.
  • JEOL: JSM 6300F

    Details
    ID#:
    116159
    Category:
    Scanning Electron M...
    Vintage:
    1993 
    field emission SEM | Capability: up to 500,000x, 0.5 to 30kV | | Includes: | Console | Gun assembly | Mechanical pump | Bake unit. | EDX has been removed
  • JEOL: JSM-6330F

    Details
    ID#:
    9071903
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6340F

    Details
    ID#:
    9052725
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 6300F

    Details
    ID#:
    127276
    Category:
    Scanning Electron M...
    Field emission SEM | De-installed 2003 | Crated.
  • JEOL: JSM IC848A

    Details
    ID#:
    9039276
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) with EDS, 6" | | Includes: | Full element analysis capability | Large chamber design, 150 mm samples | Load lock | Full scanning in X and Y axis | Observation of 10 nm or less | Thermo Noran EDS detector (mounted) | No software or other hardware | | Accelerating voltage: | 0.2 to 40 kV (linked with bias, lens currents, and coil currents) | | Magnification: | 10x (at 39mm working distance) to 300,000x | 100x (fixed) | | Speciment movment rage: | X-direction: 160mm | Y-direction: 160mm | Z-direction: 38mm | Tilt : 0 to 60 degree | | Specimen exchange: | By airlock: Up to 204mm dia. specimen holders | By stage drawout: Available | | Speciment holder: | 12.5mm dia. x 10mm H specimens (height adjustable) | 102mm dia. x 0.5mm H specimens | 153mm dia. x 1mm H specimens | 204mm dia x 1mm H specimens.
  • JEOL: JSM-6330F

    Details
    ID#:
    9041540
    Category:
    Scanning Electron M...
    Field emission microscope | Oxford INCA 250 EDS system | Field emission | 1997 vintage.
  • JEOL: JSM 6340F

    Details
    ID#:
    9013669
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope (FESEM) | Oxford 7158 INCA Microanalysis system | JEOL stage controller | PC, monitor, HP Vectra Pentium 3 CPU | Windows NT 98 | HP Laser printer | Exela Cool Ace model CA-2500 cooling unit | Large chamber.
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