JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 840

    Details
    ID#:
    9063336
    Category:
    Scanning Electron M...
    Vintage:
    1989 
    Scanning electron microscope, (SEM) | Resolution 40nm WD 8mm, 35kV | Magnification 10X-300,000X | Eucentric large goniometer specimen stage X, Y, Z, tilt, rotation | Image modes: Secondary and Backscattered Electron | LaB6 electron source | Acceleration Voltage 0.2 - 40kV | Vacuum System: Rotary pump and oil diffusion | Power: 240/220/200/180 VAC, 6kVA, 50/60 Hz | | Digital Imaging: | JEOL Orion Imaging software and Win XP computer | Capable of documenting annotation and measurement | Image processing | Acquired image scan resolution: | 2560 x 2048 | 1280 x 1024 | 960 x 768 | 640 x 480 | | Cooling: | Water: 1 gallon/min | Temperature: 70 ±10°F | Pressure: 20 psi | | 1989 vintage.
  • JEOL: JSM 5400

    Details
    ID#:
    9079563
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5800LV

    Details
    ID#:
    9079565
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 5410LV

    Details
    ID#:
    9080015
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 5610

    Details
    ID#:
    9008606
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope | Resolution (high vacuum mode): 3.5nm (3.5nm@Acc.volt30kv,WD6mm) | Accelerating voltage: x0.5 to 30kV (53 steps) | Images: SEI, BEI (COMPO, TOPO, Shadow) | Magnification: 18(18x@WD48)x to 300,000x (in 136 steps) | Specimen size: less than 6" | Specimen stage: | Eucentric goniometer | X: 80mm | Y: 40mm | Z: 5 to 48mm | Tilt: -10° to 90° | Rotation: 360° | Electron gun: W filament | Gun bias: automatically settable for all accelerating voltages | Image shift: +12 micrometer or -12 micrometer | Displayed image: 640 x 480 pixels(640×480, 1280×960pixels) | Analytical functions: OXFORD ISIS EDS system | Detectable element range: 5B to 92U | Backscatter | EDS | 2002 vintage.
  • JEOL: JSM 7500

    Details
    ID#:
    9055561
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6335F

    Details
    ID#:
    9080017
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope, (FESEM). |
  • JEOL: JSM 6300F

    Details
    ID#:
    53576
    Category:
    Scanning Electron M...
    FE SEM.
  • JEOL: JSM 5410 / MP 5410

    Details
    ID#:
    128977
    Category:
    Scanning Electron M...
    Scanning electron microscope | Voltage: 100V +/- 10V | Current maximum: 25A | Starting current maximum: 70A | Power maximum: 25 kVA | Frequency: 1 phase, 50 / 60 Hz | Ground resistance maximum: 100 ohm | Cooling water: 2 liters per minute.
  • JEOL: JSM 840F

    Details
    ID#:
    9081172
    Category:
    Power Supplies
    Main power console.
  • JEOL: JSM 5510

    Details
    ID#:
    9082949
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 7500FA

    Details
    ID#:
    9083772
    Category:
    Scanning Electron M...
    Vintage:
    2006 
    Scanning electron microscope (SEM) | | Second electronic resolving power: 1.0 nm (accelerating voltage : 15 kV), 1.4 nm (accelerating voltage : 1 kV for GB mode), 2.0 nm (accelerating voltage: 1 kV for SEM mode) | Magnification: 25 to 19,000 x for LM mode, 100(W, D 25 mm) to 1,000,000 x (W, D 8 mm) for SEM mode | Kinds of images: secondary electron image and backscattered electron image (low angle reflection electron detector) | Accelerating voltage: 0.5 to 30 kV for SEM mode, 0.1 to 4.0 kV for GB mode | Electron gun: method: in cooling electrode field emission with emitter tungsten <310> negative pole | Sample stage: motor drive in 5 axis ( X, Y, Z, T and R), 70 mm for X axis, 50 mm for Y axis, W D 1.5 to 25 mm for Z axis, -5 to 70°for T axis (ramp) and 360°for R axis (rotary) | EDS: JDE-2300F attached | Others: cooling water circulation apparatus and plasma coater attached | | 2006 vintage. | |
  • JEOL: JSM T3000

    Details
    ID#:
    128993
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6400F

    Details
    ID#:
    126936
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
Copyright © 2011 Capital Asset Exchange & Trading LLC. Tous droits réservés.