JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9171178
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Not included: OXFORD monoCL Luminescence system.
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System | Rotary pump | Power supply.
  • JEOL: JSM 6400

    Details
    ID#:
    9184151
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Torr range: 10^-7 | Stage retrofitted with stepper motors | Motion control system | Diffusion pumped | With a cryo trap | Stock everhard-thornley detector | Backscatter detector | Not included: | NPGS system | Accessories: | Load-lock | Fast beam blanker | With a spare driver module | No EDS or WDS.
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6490LV

    Details
    ID#:
    9123092
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX EDS | PC System with JSM-6490LV software | PC with Noran software | Mechanical Pump | Flanges | Cables | Replacement cartridges | (2) Chiller boxes | Noran cables | Interface box with cables | Differential pump water hose | Low vacuum pipe | Tractor unit | RP filters | LV Pinami gauge | LN2 sensor | | Resolution: | -High vacuum mode: 3.0 nm (30 kV) | -Low vacuum mode: 4.0 nm (30 kV) | Accelerating voltage: 0.3 to 30 kV | Magnification: 5x to 300,000x | Filament: pre-centered W hairpin filament with continuous auto bias | Objective lens: super conical | Objective lens apertures: click-stop type (3-stop variable); fine position controllable with X-Y directions | Maximum specimen size: 8" coverage, 12" specimen can be loaded | Specimen state: 5-axis computer controller eucentric goniometer; X 125 mm, Y 100 mm, Z 5 to 80 mm, T -10 to 90°, R 360° endless | Vacuum mode changeover: automatic (PC interface controlled) | | EDAX: | Model: PV77-57810-ME | Active area: 10 mm2 | Amplifier model: 204 B+ | Window type: super ultra-thin window (SUTW) | Resolution: <132 eV @ MnKa @ 1 Kcps | Insertion / retraction: manual.
  • JEOL: JSM 6510

    Details
    ID#:
    9184193
    Category:
    Scanning Electron M...
    Vintage:
    2012 
    Scanning electron microscope (SEM) | Tungsten filament | Includes: | Standard recipe | Stigmator memory | Dual live image | Full size image display | Pseudo color | Digital zoom | Dual magnification | Measurement | Auto image archiving | JED-2300 EDS (JSM-6510LA and JSM-6510A) | Resolution HV mode: 3.0 nm (30 kV), 8nm (3 kV), 15 nm (1 kV) | LV Mode: 4.0 nm (30 kV) (JSM-6510LA and JSM-6510LV) | Magnification: 5 x 300,000 (on 128 mm x 96 mm image size) | Preset magnifications: (5) Steps | Custom recipe: | Operation conditions: | Optics | Image mode | LV Pressure | Image mode: | Secondary electron image | REF Image | Composition (JSM-6510LA and JSM-6510LV) | Topography (JSM-6510LA and JSM-6510LV) | Shadowed (JSM-6510LA and JSM-6510LV) | Accelerating voltage: 0.5 kV to 30 kV | Filament: Factory pre-centered filament | Electron gun: Automated, manual override | Condenser lens: Zoom condenser lens | Objective lens: Super conical objective lens | Objective lens apertures: (3) Stages, XY fine adjustable | Electrical image shift: ± 50 μm (WD = 10 mm) | Auto functions: Focus, brightness, contrast, stigmator | Eucentric large-specimen stage: | X: 80 mm | Y: 40 mm | Z: 5 mm to 48 mm | Tilt: −10° to 90° | Rotation: 360° | Reference image (navigator): (4) Images | Maximum specimen: 150 mm diameter | PC: IBM PC/AT Compatible | OS: Windows 7 | Monitor: 19" LCD | Frame store: 640 x 480, 1280 x 960, 2560 x 1920, 5120 x 3340 | Multi image display: | (2) Images | (4) Images | Network: Ethernet | Image format: BMP, TIFF, JPEG | Fully automated pumping system: | DP1(diffusion pump) | RP1(rough pump) | 2012 vintage.
  • JEOL: JSM 5600LV

    Details
    ID#:
    9005306
    Category:
    Scanning Electron M...
    FE-SEM, with EDX and fine coater.
  • JEOL: JSM 5610

    Details
    ID#:
    9008606
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope | Resolution (high vacuum mode): 3.5nm (3.5nm@Acc.volt30kv,WD6mm) | Accelerating voltage: x0.5 to 30kV (53 steps) | Images: SEI, BEI (COMPO, TOPO, Shadow) | Magnification: 18(18x@WD48)x to 300,000x (in 136 steps) | Specimen size: less than 6" | Specimen stage: | Eucentric goniometer | X: 80mm | Y: 40mm | Z: 5 to 48mm | Tilt: -10° to 90° | Rotation: 360° | Electron gun: W filament | Gun bias: automatically settable for all accelerating voltages | Image shift: +12 micrometer or -12 micrometer | Displayed image: 640 x 480 pixels(640×480, 1280×960pixels) | Analytical functions: OXFORD ISIS EDS system | Detectable element range: 5B to 92U | Backscatter | EDS | 2002 vintage.
  • JEOL: JSM 6100

    Details
    ID#:
    9157307
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6300V

    Details
    ID#:
    9016383
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 6360

    Details
    ID#:
    9032379
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Currently in a lab.
  • JEOL: JSM 6401

    Details
    ID#:
    9073237
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 5900LV

    Details
    ID#:
    9123096
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Variable pressure | Turbo pump | Available options: EDX with SDD or EDAX with Si (Li).
  • JEOL: JSM T330A

    Details
    ID#:
    9003668
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6340F

    Details
    ID#:
    9003281
    Category:
    Scanning Electron M...
    SEM | | Specifications:   | | a. Performance | SEI Resolution : 1.2 nm guaranteed (Acc. V. = 15kV) | 2.5 nm guaranteed (Acc. V. = 1kV) | Magnification : x 25 (WD 25 mm) to x 650,000 | Accelerating Voltage : 0.5 to 2.9 kV (10 V steps) | 2.9 to 30 kV (100 V steps) | Probe Current : 2 x 10-9 to 10-13 A | Image Mode : SEI, LEI |   | b. Electron Optical System | Electron Gun : High-resolution Conical Anode Field Emission Gun with Cold Cathode | Alignment : Mechanical and Electromagnetic Deflection | Condenser lens (C.L.) : Electromagnetic 2-stage zoom lens | Objective lens (O.L.) : Superconical CF (corrected field) lens | O.L. Apertures : Variable, 4-step click-stop type |   | c. Specimen Stage | Type : Fully Eccentric Goniometer | Movement :  X = 50mm, Y = 70mm, Z = 23mm | Tilt = -5* to +45* | Rotation = 360* endless (motor driven) | Motorized movement for all 5 axes |   | d. Specimen Chamber | Max Specimen size : 100mm or 4inch diameter | Specimen Exchange: Airlock type (100mm dia. or less) | EDS Detector : WD = 15 mm | Take-off Angle = 20* |   | e. Display System | Display Tubes | Observation: One, 17-inch color CRT | Recording : One, 5-inch ultra high resolution short-persistence CRT | Scanning Modes : PIC (Full, ½ & ¼ frame), Bright-up, line Profile, Spot | Display Modes : NORM, WFM, D-MAG, YZ Mod, FREZ, DUAL Display, Different magnification Images | Auto Functions : Auto Focus, Auto Astigmatism Correction, Auto Contrast & Brightness | Image Memory : 1280 x 1024 x 8 bits.
  • JEOL: JSM 5510

    Details
    ID#:
    9151679
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6335F

    Details
    ID#:
    9164764
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope (FE-SEM) | Performance: | Resolution: | Secondary electron image: 1.5nm | Accelerating voltage: (Acc. V.) 15 kV 5.0nm | Accelerating voltage: (Acc.V.) 1 kV | Magnification range: | 130x (WD 25 mm) to 650,000x (WD 8 mm) | Magnification corrections: | Accelerating voltage | Working distance (WD) | Image modes: | (SEI) Secondary electron image | Options | COMP: Backscattered electron image in the composition mode | TOPO: Backscattered electron image in the topography image mode | Electron probes: | Accelerating voltage: 0.5 to 30 kV | Acc. V. step: | 10 V steps for 0.5 to 2.9 kV | 100 V steps for 2.9 to 30 kV | Probe current: 1*10(-13) to 2*10(-9) A | Construction: | Electron optical system (EOS) | Electron gun: | Type: Field emission gun with cold cathode | Emitter: Tungsten single crystal <310> emitter | Alignment: Mechanical and electromagnetic deflection | Lens system: | EOS Modes: SEM, ALP (Alignment pattern) | Condenser lens (CL): Electromagnetic 2-stage zoom CL | Lens clear function: Built-in for hysteresis elimination | Objective lens (OL): | Super conical | Corrected field objective lens | Lens clear function: Built-in for hysteresis elimination | Focus link: Built-in for Acc.V. change | Automatic magnification correction: Built-in for Acc.V. and / or w.n. change | OL apertures: Click-stop type | Wobbler: | Built-in for OL aperture | Stigma center magnification | Stigmators: | Electromagnetic 8-pole | XIV direction control | Stigmator center adjustable | Automatic or manual operation | Scan and image shift system: | Scanning coil: Electromagnetic 2-stage deflection | Image fine shifter: | Electromagnetic | ± 1 0 Lm shifts in X and Y | Linked to Acc.V | EOS Functions: | Dynamic focus: Specimen tilt | Image rotation correction: WD, EOS Mode change | Scan rotation: Built-in with image rotation correction | Specimen stage: | Type: Fully eucentric goniometer stage | Stage drive: Computer controlled X / Y / R motor drive | Specimen movement: | X: 50 mm (Motor drive / manual) | Y: 70 mm (Motor drive / manual) | Z (Coarse): 4, 8, 15, 25 and 39 mm | Z (Fine): -2 to 2 mm (For each W.D.) | T (Tilt): -5 to +600 | R (Rotation): 3600 Endless | Specimen position (X, Y, R): Displayed on imaging screen and motor | Specimen position file: Save / Read specimen position data | Coordinates: Stage coordinates | Motor drives: | Joystick (X, Y, R] | Mouse point | Step motion | Specimen holders: | (1) For 12.5(dia) x 10 (H) mm specimen | (1) For 32(dia) x 20 (H) mm specimen | Holder selection: Standard | Movement range: Auto | Specimen exchange chambers: | Standard [SM-31010] | Large [SM-31160] | Absorbed current terminal: Built-in | Safety buzzer: Built-in | EDS: Yes | Electron detection systems: | Collector | Scintillator | Light guide | Photomultiplier tube | Accelerating voltage: 10 kV | Video amplifier control: Manual control | Noise canceler: | Detector: Externally aligned in X and Y | Applied image signal: | Analog signals: | SEI | COMP | TOPO | AUX | Amplifier gain: Linked to Acc.V. | Operation system: | Basic system: | Personal computer (PC): IBM PC / AT | Operating system: Windows NT | RAM: 64 MB minimum | Network connection: Ethernet (10/100 base T) | Operation: Graphical user interface | Display tubes: | For imaging: | SVGA Monitor | 1280(H) x 1024(V) Pixels | | For recording: | One 5-inch ultrahigh-resolution | short-persistence CRT [SM-34090] | Scanning modes: | Pictures: | Full frame scan | Reduced scan (1/2 Frame size) | Field limiting scan | 2-Partition (Different magnification / Different image) | 2-Partition wide display | 4-Partition display | Modes: | Spot | Reduce | Scaler | Image filing: | Format: | BMP | JPEG | TIFF | Image selector: | Image modes: | SEI | COMP | TOPO | AUX | Scan speed: | Number of pixels: 1280 (H) x 1024 (V) | Scan speed (50 Hz area): | No. Vertical(s) Horizontal(ms) | 1 0.28 0.21 | 2 0.5 0.42 | 3 0.9 0.83 | 4 1.8 1.67 | 5 3.5 3.34 | 6 6.9 6.68 | 7 19(16) 18.6(15.0) | 8 38 (31) 36.7(30.0) | 9 79(66) 77.0(63.8) | 10 121(100) 117.6(97.0) | Display modes on CRT: | Image: Standard | Controls: | Acc.V. ON / OFF Switch | ACC.V. | Acc.V. exchange switch | Emission current | Reset switch | Pull-Down menu | Icons | Data display on CRT: | Datas: | Accelerating voltage | Magnification | Micron bar with micron | Display position: Horizontally | Character background: Bright on dark background | Image condition adjustment: | Contrast and brightness: Manual with knobs | Contrast and brightness correction: | Linked to scan speed | Ace. V. | Probe current | EOS Mode | | Image processing system: | Functions: | Averaging: | Accumulation average: 1 to 999 Times | Integration: Simple accumulation | Color modes: Black and white | Auto functions: | Auto focus: Yes | Auto stigmator: Yes | Auto brightness and contrast: Yes | Photo recording systems: | Scanning Image [SM-34090] | UHR Camera [SM-45150] | Scanning Image [SM-34090]: | Cathode ray tube [CRT): 5-inch ultra-high resolution | Scanning method: Digital scanning | Exposure time: 20 sec | Number of pixels: 1,280 x 1024 x 8 bits | Size of image: 92 x 73.5 mm | Location: Right side of SEM | UHR camera (SM-45150): | Lens: F:75 mm, F:5.6 | Aperture: 5.6, 8, 11, 16, 22 | Adapters: | 5451 Film holder | 550 Film holder | PRO-SD 120 Roll Film holder | Film holders: | Standard: 85 x 108 mm film holder | Options: | SM-45051 Polaroid: 5451 Film holder | SM-45060 Polaroid: 550 Film holder | SM-45042 MAMIYA: PRO-SD 120 Roll film holder | Vacuum system: | Gun chambers: | Evacuated by an ultrahigh vacuum dry evacuation system | With ion pumps | Specimen chamber: | Evacuated by a fully automatic DP-DP cascade evacuation system | Partial evacuation: | Gun | Specimen | Airlock chambers | Dry nitrogen gas connector: With automatic nitrogen gas stopper | Ultimate pressure: | Gun chamber: 10(-7) Pa order | Specimen chamber: 10(-4) Pa order | Evacuation time: 1 Min | Gun chamber isolation valve: Pneumatic drive | Specimen airlock valve: Manual drive | Vacuum gauges: | (2) Pirani gauges | (2) Ion pumps current monitor | Vacuum pumps: | (1) 60 lit/ s ion pump (SIP) | (2) 20 lit/ s SIPs | (1) 420 litis diffusion pump (DP) | (1) 120 litis DP | 100 lit/min. direct drive rotary pump (RP) | Installation and requirements: | Power and grounding: | Power: | Single-phase | 200 V (±10%) AC | 50/60 Hz, | 6 kVA (Standard configuration) | Ground: 100Ω or less | Cooling water: | Supply: 14 mm OD or ISO 7/1 Rc 1/4 internal thread | Flow rate: 3 lit/min | Pressure: 0.05 to 0.25 MPa | Temperature:15 to 25C | Drain: 25 mm ID or ISO 7/l Rc 1/4 internal thread | Dry nitrogen gas: | Pressure: 0.4 to 0.5 MPa | Coupler: ISO 7/1 Rc 1/4 internal thread | Environment: | Temperature: 15 to 25° C | Humidity: 60% or less | Stray AC magnetic field: | 0.3 mT (p-p) | W.D. 15 mm | Acc.V. so kV | Floor vibration: 3µm (p-p) | Less at sine wave of over 5 Hz | Acoustic noise: 65 dB | Floor space: 3,000 x 2,800 mm | Door width: 850(W) x 2,000(H) mm.
  • JEOL: JSM 6340F

    Details
    ID#:
    9076781
    Category:
    Scanning Electron M...
    Vintage:
    1998 
    FE-Scanning electron microscope (SEM) | Software: Windows 2000 | Performance | Secondary electron image resolution | 15 kV: 1.2 nm | 1 kV: 1.2 nm | Magnification | Zoom mode (MAG): 25x to 2,000 X in LM mode | 500x to 650,000X in HR mode (WD 8 mm) | Probe current: 10- ' to 10-" A | Electrin optical system | Electron gun | Type: Cold-cathode field emission. | Accelerating voltage: 0.5 to 30 kV | 0.5 to 2.9 kV: variable in 0.01 kV steps | 2.9 to 30 kV: variable in 0.1 kV steps | Emission current: 4,8,12 µA | Alignment: | Mechanical horizontal shift | Electromagnetic deflection | Lens system: | Condenser lens: 2-stage, electromagnetic, zooming system | Aperture angle control lens (ACL): Electromagnetic lens | Electron optical system (EOS) operating modes | SEM (HR): high resolution scanning images | SEM (LM): low-magnification scanning images | ALP: alignment patterns | Focusable working distance: 2t025mm | Automatic focus: | Image rotation compensator | Dynamic focus | Objective lens apertures: 50,70,70, 110 µm in dia | Stigmators | Wobbler | Specimen stage | Type: Fully eucentric goniometer stage | Specimen movement range | X-direction: 0-50mm | Y -direction: o -70mm | Z-direction: Stepwise change; 2, 3, 6, 8, 15 and 25 mm | Tilt: -5 to 45 deg | Rotation: 360 deg endless | Working distances: 2,3,6,8,15 and 25 mm | Electron detector system | Detector | Photomultiplier voltage | Video amplifier control | Contrast control | Brightness control | Noise canceler: | Detector | Backscattered electron detector: | Imaging modes | Detector | Operation and display system | Image data processing system | Automatic functions | Keyboard control | Photographic recording system | Scaler | Vaccum system | Safety devices | Installation Requirements: | Power: 200 V, 50/60 Hz single phase, 6 kVA | Grounding terminal: 1,100 Ω or less | Cooling water: | Flow rate: 3 R. l/min or higher | Pressure: 0.05 to 0.25 MPa | Temperature: 20 ± 5 deg C | Faucet: 1, ISO 7/1 Rc 1/4 coupling or 1, 14 mm 0.0. nozzle | Drain: 1, ISO 711 Rc 1/4 coupling or 1, larger than 25 mm I.D. nozzle | 1998 vintage.
  • JEOL: JSM 5310

    Details
    ID#:
    9168864
    Category:
    Scanning Electron M...
    Vintage:
    1995 
    Scanning electron microscope (SEM) | Includes: | OXFORD EDX Detector | 1995 vintage.
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