Occasion VARIOUS Lot of equipment #293821329 à vendre en France

Qty / Make / Model / Description (1) / AMAT / CX300 / Defect review system (1) / AMAT / CX200 / Defect review system (1) / AMAT / SemVision G2 / Defect review system (1) / AMAT / SemVision G3 FIB / Defect review system (1) / AMAT / SemVision G4 / Defect review system (1) / AMAT / SemVision G5 / Defect review system (1) / AMAT / GX / Defect review system (1) / AMAT / VeritySEM 2 / Scanning Electron Microscopes (SEM) (1) / AMAT / VeritySEM 4i Plus / Scanning Electron Microscopes (SEM) (1) / AMAT / Complus 4T / Darkfield inspection system (1) / HITACHI / CG 4000 / Scanning Electron Microscope (SEM) (1) / HITACHI / CG 4100 / Scanning Electron Microscope (SEM) (1) / HITACHI / CG 6300 / Scanning Electron Microscope (SEM) (1) / HITACHI / S-9200 / Scanning Electron Microscope (SEM) (1) / HITACHI / S-9220 / Scanning Electron Microscope (SEM) (1) / HITACHI / S-9260A / Scanning Electron Microscope (SEM) (1) / HITACHI / S-9300 / Scanning Electron Microscope (SEM) (1) / HITACHI / S-9300-T /Scanning Electron Microscope (SEM) (1) / HITACHI / S-9380 / Scanning Electron Microscope (SEM) (1) / HITACHI / S-8820 / Scanning Electron Microscope (SEM) (1) / HITACHI / RS 6000 / Scanning Electron Microscope (SEM) (1) / KLA / TENCOR / 2820 / RF Vector signal generator (1) / KLA / TENCOR / 6220 / Precision current source (1) / KLA / TENCOR / 2135 XP / Wafer inspection system (1) / KLA / TENCOR / 2138XP / Wafer inspection system (1) / KLA / TENCOR / AIT II / Defect inspection system (1) / AIT XP / Wafer inspection system (2) / KLA / TENCOR / Archer 200 AIM / Overlay inspection systems (1) / KLA / TENCOR / Archer 300 AIM / Overlay inspection system (1) / KLA / TENCOR / Archer 300 LCM / Overlay inspection system (1) / KLA / TENCOR / Archer 500 / Overlay inspection system (1) / KLA / TENCOR / Archer A200 AIM / Overlay inspection system (1) / KLA / TENCOR / Archer A300 AIM / Overlay inspection system (1) / KLA / TENCOR / Archer 200 / Overlay inspection system (1) / KLA / Archer 300 / Overlay measurement system (1) / KLA / Archer 300 AlM / Overlay measurement system (1) / KLA / TENCOR / ASET F5X / Film thickness measurement system (1) / KLA / TENCOR / CV300R / Wafer edge inspection system (1) / KLA / TENCOR / eDR-7100 / Defect Review (DR) Scanning Electron Microscope (SEM) (2) / KLA / TENCOR / ES35 / E-Beam inspection systems (1) / KLA / TENCOR / FX200 / Thickness measurement system (1) / KLA / TENCOR / 2115-IS / Wafer inspection system (1) / KLA / TENCOR / 2118 / Wafer inspection system (1) / KLA / TENCOR / 2122 / Wafer inspection system (1) / KLA / TENCOR / 2135 / Wafer inspection system (2) / KLA / TENCOR / 2138 XP / Wafer inspection systems (2) / KLA / TENCOR / 2139 / Wafer inspection systems (2) / KLA / TENCOR / 2351 / Wafer defect inspection systems (1) / KLA / TENCOR / 2367 / Wafer inspection system (1) / KLA / TENCOR / 2370 / Wafer inspection system (1) / KLA / TENCOR / 2371 / Wafer inspection system (1) / KLA / TENCOR / 2820 / Wafer inspection system (1) / KLA / TENCOR / 5100 / Overlay inspection system (1) / KLA / TENCOR / 5100 XP / Overlay inspection system (1) / KLA / TENCOR / 5105 / Inspection system (1) / KLA / TENCOR / 5200 / Overlay measurement system (1) / KLA / TENCOR / 5300 / Inspection system (1) / KLA / TENCOR / 8920 / Inspection system (1) / KLA / TENCOR / AIT Fusion / Inspection system (1) / KLA / TENCOR / AIT I / Darkfield system (1) / KLA / TENCOR / AIT II / Defect inspection system (1) / KLA / TENCOR / AIT III / Defect inspection system (1) / KLA / TENCOR / AIT UV / Darkfield inspection system (1) / KLA / TENCOR / AIT UV+ / Darkfield inspection system (1) / KLA / TENCOR / AIT XP+ / Wafer inspection system (1) / KLA / TENCOR / Archer 10 / Overlay inspection system (1) / KLA / TENCOR / Archer 10 AIM / Overlay inspection system (1) / KLA / TENCOR / Archer 10 XT / Overlay inspection system (1) / KLA / TENCOR / Archer 100 AIM / Overlay inspection system (1) / KLA / TENCOR / Archer 200 AIM+ / Overlay inspection system (1) / KLA / TENCOR / Archer 500 AIM / Overlay inspection system (1) / KLA / TENCOR / FX 200 / Film thickness measurement system (1) / KLA / TENCOR / CV300 / Wafer edge inspection system (1) / KLA / TENCOR / eDR-7000 / Defect inspection system (1) / KLA / TENCOR / eS37 / Inspection system (1) / KLA / TENCOR / F5X / Film thickness measurement system (1) / KLA / TENCOR / FLX-5400 / Thin film stress measurement system (1) / KLA / TENCOR / FX200 / Thickness measurement system (1) / KLA / TENCOR / HRP 220 / Surface profiler (1) / KLA / TENCOR / HRP 340 / Profiler (1) / KLA / TENCOR / OP 2600 / Film thickness measurement system (1) / KLA / TENCOR / OP3290 / Film thickness measurement system (1) / KLA / TENCOR / Puma 9000D / Darkfield inspection system (1) / KLA / TENCOR / Puma 9100 UI / Darkfield inspection system (1) / KLA / TENCOR / Puma 9120 / Darkfield inspection system (1) / KLA / TENCOR / Puma 9130 / Darkfield inspection system (1) / KLA / TENCOR / Puma 9100 IS / Darkfield inspection system (1) / KLA / TENCOR / Puma 9130 IS / Darkfield inspection system (1) / KLA / TENCOR / Puma-IS / Darkfield inspection system (1) / KLA / TENCOR / RS-100 / Resistivity mapping system (1) / KLA / TENCOR / RS-35 / Resistivity mapping system (1) / KLA / TENCOR / RS-55 / Resistivity mapping system (1) / KLA / TENCOR / SCD-XT / Scatterometry machine (1) / KLA / TENCOR / SL305 / System (1) / KLA / TENCOR / SL3 UV / Wafer inspection microscope (1) / KLA / TENCOR / SP2 / Surface inspection system (1) / KLA / TENCOR / UV 1050 / Film thickness measurement system| (1) / KLA / TENCOR / 2125 / Overlay inspection system (1) / KLA / TENCOR / 2139 / Wafer inspection system (1) / KLA / TENCOR / 2139-IS / Wafer inspection system (1) / KLA / TENCOR / 2139-IS / Wafer inspection system (1) / KLA / TENCOR / RS6000 / System (1) / KLA / TENCOR / RS6000E / System (1) / KLA / TENCOR / RS-75 / Resistivity mapping system (1) / KLA / TENCOR / SP1 TBI / Surface inspection system (1) / KLA / TENCOR / SP1-TBl Frame / Surface inspection system (1) / KLA / TENCOR / SP2-XP / Surface inspection system (1) / KLA / TENCOR / UV 1280 / Film thickness measurement system (1) / LEICA / INS 3000 / Wafer defect inspection system (1) / LEICA / INS 3300 / Wafer defect inspection system (1) / LEICA / LDS 3000 / Defect inspection system (1) / NIKON / OST-3100 / Microscope (1) / NIKON / Optistation 7 / Wafer inspection system (1) / CANON / FPA-5500 / i-Line stepper (2) / KLA / TENCOR / THERMA-WAVE / TP630XP / Metrology systems.