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ID: 9131532
Taille de la plaquette: 4"
Style Vintage: 2010
Direct Write E-beam Lithography System, 4" Specifications: General: Electron-beam lithography system that employs spot-beam vector scanning for sub-micron and nano-lithography Two selectable writing modes: High-resolution writing mode (5th Lens mode) for nano-lithography High-speed writing mode (4th Lens mode) for sub-micron lithography Accelerating voltage is also selectable either 25kV or 50kV Beam scanning speed: 12MHz Stage position is controlled by high-precision laser interferometer Control system: Microsoft® Windows® PC Minimum feature size: High-resolution writing mode 50Kv: </= 10 nm (at the field center) Overlay accuracy: High-resolution writing mode 50kV:</= 40 nm (3 sigma) High-speed writing mode 25kV (1200 um Field): </= 70 nm (3 sigma) Field stitching accuracy: High-resolution writing mode 50kV: </= 40 nm (3 sigma) High-speed writing mode 25kV (1200 um Field): </= 70 nm (3 sigma) Performance: Electron beam: Beam shape: Spot (Gaussian) beam Accelerating voltage: 50 kV, 25 kV Beam current: 30 pA to 20 nA Beam deflection method: Vector scan (Random access) Writing field: High-resolution writing mode: 50kV: Up to 100 um X 100 um 25kV: Up to 200 um 200 um High-speed writing mode: 50kV: Up to 1000 um 25kV: Up to 2000 um Beam positioning DAC: (18) bits Beam-positioning unit: High-resolution writing mode: 50kV: 0.5 nm 25kV: 1 nm High-speed writing mode: 50kV: 5 nm 25kV: 10 nm Beam scanning DAC: (12) bits High-resolution writing mode: 50kV: 0.5 nm x N 25kV: 1 nm x N High-speed writing mode: 50kV: 5 nm x N 25kV: 10 nm x N Beam scanning speed: 83.3 ns to 4 ms/scanning step size (12 MHz to 250 Hz, respectively) Field correction function: Deflection correction: Amplitude, Rotation Deflection aberration correction: Deflection distortion Stage movement: Method: Step and Repeat Stage position measurement: Laser interferometer Positional step size: lambda/1024 (approx. 0.6 nm) Stage movement range: 104 x 75 mm Writing area: 75 x 75 mm Moving speed: Up to 10 mm/s Material Transfer: Loader Manual loader: Single cassette loading mechanism Cassette (Substrate Holder) Wafer size: 2 to 4 inch Wafer loading/unloading: Manual Input pattern data: Data format: JEOL52(V3.0) Writing field: High-resolution writing mode: 50kV: Up to 100 um x 100 um 25kV: Up to 200 um x 200 um High-speed writing mode: 50kV: Up to 1000 um x 1000 um 25kV: Up to 2000 um x 2000 um Specified resolution: High-resolution writing mode: 50kV: 0.5 nm 25kV: 1 nm High-speed writing mode: 50kV: 5 nm 25kV: 10 nm Writing functions: Cyclic correction: Dose correction, Beam position correction, Beam deflection system correction Shot time modulation: Up to 256 ranks Field shift overlapping writing Design Functions: Data format: JEOL01 Data conversion output: JEOL52(V3.0) Draw-able figure: Rectangle, Circle, Polygon, Line, Ring Editing: Flip, Rotation, Copy & Paste, Duplicate, Grouping Utility: Reticular, Radial, Fresnel ring generator Figure map display: Display whole and partial drawing Others: JEOL52(V3.0) display Configration: Component Systems Electron beam column Electron source: ZrO/W emitter (Thermal field emission source) Electron beam optics: Beam alignment coil Beam blanker Lens (de-magnifying, illumination) Objective lens (4th Lens, 5th Lens) Beam deflector (1st Deflector, 2nd Deflector) Stigmator: Objective aperture (4 holes) Electron beam detection: Back-scattered electron detector, Secondary electron detector, Absorbed current detector Material-driving system: XY stage, Laser interferometer system Material transfer: Manual loader (one cassette can be loaded) Control CPU system Personal computer: HP series Workstation: SUN series Board CPU Evacuation system: Vacuum pumps, Valves Frame Anti-vibration: Mount Software Operating system Personal computer: Windows XP Workstation: Solaris 10 Writing preparation: Pattern design GUI System control: Main GUI, System calibration GUI, Writing GUI Installation requirements: Power Supply Voltage and Capacity: Single-phase, 100 V, 4 kVA: (2) Lines Single-phase, 200 V, 8 kVA: (1) Line Three-phase, 200 V, 4.8 kVA: (1) Line Power supply frequency tolerance 50 Hz regions: 47 Hz to 53 Hz 60 Hz regions: 57 Hz to 63 Hz Voltage variation tolerance For 1 cycle or more: -5% to +10 % For less than 1 cycle Sag (voltage sink): </= 10 % Surge (voltage rise): </= 10 % Notch: </= 200 V Spike: </= 200 V Grounding (forbidden to be used with other instruments) Ground wire (for exclusive use): 100 0hm or less (D class) For 0.15 MHz to 0.5 MHz: </= 79 dBuV (quasi peak value); </= 66 dBuV For 0.5 MHz to 30 MHz: </= 73 dBuV (quasi peak value); </= 60 dBuV For less than 0.15 MHz, compatible with the level at 0.15 MHz Primary Cooling Water Flow rate: 6 L/min (at 25 C) or 13 L/min (at 32 C) Supply pressure: 0.15 to 0.5 MPa gauge pressure at maximum Temperature: 15 to 32C Connection form: Braided hose (inside diameter 15 mm, outside diameter 22 mm) Overflow drain: No backing pressure pH (at 25 C): 6.0 to 8.0 Electrical conductivity (mS/m) (at 25 C): </= 30 Chloride ion (mg Cl–/L): </= 50 Sulfate ion (mg SO42–/L): </= 50 Total hardness (mg CaCO3/L): </= 70 Calcium hardness (mg CaCO3/L): </= 50 Ionic silica (mg SiO2/L): </=30 Iron (mg Fe/L): </= 0.3 Sulfide ion: Not detected Ammonium ion (mg NH4+/L): </= 0.1 High-pressure gas Material: Nitrogen gas or Clean Dry Air Supply pressure: 0.5 MPa Maximum flow rate: 50 L/min Connection form: 6 mm in diameter Low-pressure Gas Material: Nitrogen gas Supply pressure: 0.1 MPa Maximum flow rate: 50 L/min Temperature: 21 to 25 C Cleanliness: ISO Class 3 Purity: 99.999% or more Connection form: 1/4 inch in diameter Evacuate: For roughing vacuum pump Evacuating capacity: 500 L/min at 50 Hz, 600 L/min at 60 Hz Pressure: No backing pressure Connection form: NW25 Installation Space: 5.5 (W)x 3.5 (D)x 2.7 (H) m or more Entrance: 2.0 (W) x 2.1 (H) m or more Room Temperature: 21 to 25C Stability: Within +/- 0.2C/h (Main console area); Within 1C/h Other units area Humidity: 60% or less (non condensing) Airflow: about 0.3 m/s Stray magnetic field Commercial frequency: (BX2+BY2+BZ2)1/2 </= 0.1 uT Drift component: (BX2+BY2+BZ2)1/2 </- 0.1 uT Floor Flatness: +/-1 mm within 600 x 600 mm area Sound Noise Level 20 Hz-12500 Hz: </= 65 dB 20 Hz and under: </= 90 dB 2010 vintage.
JEOL JBX-5500FS est un microscope électronique à balayage (SEM) conçu pour l'imagerie à haut débit. Il est capable de capturer des images à haute résolution dans divers modes d'imagerie, y compris l'imagerie électronique secondaire et rétrodiffusée, la cathodoluminescence et l'imagerie par tube photomultiplicateur (PMT). JBX-5500FS est équipé d'une colonne optique électronique rapide, permettant l'acquisition d'images en moins de 10 secondes. JEOL JBX-5500FS utilise une colonne SEM thermionique munie d'un pistolet à émission de champ, offrant un mode à vide bas de 5 kV pour l'imagerie de contraste élevé des échantillons non conducteurs. Cela permet de détecter des caractéristiques nanométriques avec une meilleure qualité d'image, même à des grossissements élevés allant jusqu'à 300.000x. JBX-5500FS a un étage motorisé XY de haute précision, capable de se déplacer à une vitesse maximale de 500 μ m/s, offrant des performances d'imagerie supérieures. Le microscope dispose également d'un mini-étage d'imagerie en zone étroite entièrement programmable, offrant une répétabilité ponctuelle et une précision submicronique. JEOL JBX-5500FS a un design ergonomique et est équipé d'un moniteur TFT de 21 pouces pour faciliter le fonctionnement et la visualisation des images. Il dispose également d'un logiciel intégré de reconnaissance et d'analyse d'images avec une variété d'outils, y compris une suite d'analyse de particules pour mesurer les formes, les tailles et la distribution, ainsi que des outils pour mesurer les caractéristiques avec des images optiques. JBX-5500FS a des capacités de filtrage de l'énergie supérieures, permettant à l'utilisateur de filtrer des électrons de basse et de haute énergie pour une imagerie optimale. Le filtre et le détecteur peuvent être ajustés pour améliorer le contraste et la résolution. En résumé, JEOL JBX-5500FS est un microscope électronique à balayage haute performance avec des capacités supérieures d'imagerie et de traitement d'imagerie. Il est conçu pour l'imagerie à haut débit, offrant des performances d'imagerie rapides et précises avec une qualité d'image et un contraste supérieurs.
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