Occasion JEOL JSM 7000F #293748718 à vendre en France

Field Emission Scanning Electron Microscope (FE-SEM) Electron gun: Schottky field emission Electromagnetic deflection Conical objective lens Specimen chamber, 8" Working distance: 2 to 40 mm Specimen illumination: 0.1 pA to 10 nA Resolution:1.2 nm at 30kV to 3 nm at 1kV EDS Magnification: LM Mode: 10x to 19,000x SEM Mode: 100x to 500,000x Power supply: 0.5 to 30kV.